Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM
Source abstract
Abstract
JG Wen, DJ Miller, RE Cook, NJ Zaluzec; Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Correcte
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Near-Field Optical Microscopy
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References
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