High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy)

U Kaiser; J Meyer; J Biskupek; J Leschner; AN Khlobystov; H Müller; P Hartel; M Haider; S Eyhusen; G Benner

doi:10.1017/s1431927610060496

journal article·2010-07Open access

High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy)

U Kaiser, J Meyer, J Biskupek, J Leschner, AN Khlobystov, H Müller, P Hartel, M Haider, S Eyhusen, G Benner

Microscopy and Microanalysis· Volume 16· Issue S2

Publisher page Open full text

Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Only a short abstract or summary was supplied by the source.

Source: crossref · Quality: short

Research context

Nanomaterials

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Anodic Oxide Films and Nanostructures

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References

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