DataVXMicroscopy and MicroanalysisPaper
journal article·2009-07

The Dual Challenges for FIBXTEM in the Era of sub-50nm Feature Sizes

B Tracy, J Gray, E Adem, B Phillips, A delRosario, A Myers, M Sidorov, M Guillena

Microscopy and Microanalysis· Volume 15· Issue S2
Publisher page
Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis

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References

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