DataVXMicroscopy and MicroanalysisPaper
journal article·2014-08

Artifact-Free, Long-Lasting Phase Plate

P. Kurth, S. Pattai, D. Rudolph, J. Overbuschmann, J. Wamser, S. Irsen

Microscopy and Microanalysis· Volume 20· Issue S3
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Abstract

P Kurth, S Pattai, D Rudolph, J Overbuschmann, J Wamser, S Irsen; Artifact-Free, Long-Lasting Phase Plate, Microscopy and Microanalysis, Volume 20, Issue S
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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Transport and Economic Policies

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