AXON: An In-situ TEM Software Platform Streamlines Image Acquisition, Metadata Synchronization and Data Analysis, Enabling Deeper Understanding, and Improved Reproducibility of In-situ Experimental Results
Source abstract
Abstract
Madeline Dressel Dukes, Kate Marusak, Yaofeng Guo, Jennifer McConnell, Stamp Walden, John Damiano, David Nackashi; AXON: An In-situ TEM Software Platform S
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Protochips, Inc. ; Morrisville, NC; United States
References (3)
Show source-provided references
1. Wu · Advanced Materials · 2020 · 32 · 200158210.1002/adma.202001582 ↗
2. Sarkans · Nature Methods · 2021
3. Wilkinson · Sci Data · 2016 · 3 · 16001810.1038/sdata.2016.18 ↗