Large-Aperture STEM Hexapole Cs-Corrector
Source abstract
Abstract
S Uhlemann, T Riedel, P Hartel, S Perl, M Linck, V Gerheim, H Müller; Large-Aperture STEM Hexapole Cs-Corrector, Microscopy and Microanalysis, Volume 28, I
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Corrected Electron Optical Systems GmbH , Englerstr. 28, D-69126 Heidelberg, Germany
References (10)
Show source-provided references
1. Müller · Microsc. Microanal · 2006 · 12 · 44210.1017/S1431927606060600 ↗
2. Sawada · J. Electron Microsc · 2009 · 58 · 34110.1093/jmicro/dfp033 ↗
3. Bischoff · Microsc. Microanal · 2018 · 24 · 113410.1017/S1431927618006153 ↗
4. Morishita · Microscopy · 2018 · 67 · 15610.1093/jmicro/dfy009 ↗
5. Watanabe · Microsc. Microanal · 2016 · 22 · 31010.1017/S1431927616002403 ↗
6. Hartel · Ultramicroscopy · 2019 · 20610.1016/j.ultramic.2019.112821 ↗
7. Intaraprasonk · Ultramicroscopy · 2008 · 108 · 145410.1016/j.ultramic.2008.05.013 ↗
8. Morishita · Phys.Rev.Let · 2016 · 11710.1103/PhysRevLett.117.153004 ↗
9. Ishikawa · Ultramicroscopy · 2015 · 151 · 12210.1016/j.ultramic.2014.11.009 ↗
10. Sagawa · Ultramicroscopy · 2022 · 23310.1016/j.ultramic.2021.113440 ↗