Electron Ptychography Using Fast Binary 4D STEM Data

Colum M. O'Leary; Emanuela Liberti; Sean M. Collins; Duncan N. Johnstone; Mathias Rothmann; Jingwei Hou; Christopher S. Allen; Judy S. Kim; Thomas D. Bennett; Paul A. Midgley; Angus I. Kirkland; Peter D. Nellist

doi:10.1017/s1431927619009048

journal article·2019-08Open access

Electron Ptychography Using Fast Binary 4D STEM Data

Colum M. O'Leary, Emanuela Liberti, Sean M. Collins, Duncan N. Johnstone, Mathias Rothmann, Jingwei Hou, Christopher S. Allen, Judy S. Kim, Thomas D. Bennett, Paul A. Midgley, Angus I. Kirkland, Peter D. Nellist

Microscopy and Microanalysis· Volume 25· Issue S2

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Abstract

Colum M O'Leary, Emanuela Liberti, Sean M Collins, Duncan N Johnstone, Mathias Rothmann, Jingwei Hou, Christopher S Allen, Judy S Kim, Thomas D Bennett, Pa

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques

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References (7)

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1. The financial support of JEOL (UK) Ltd. and the EPSRC is gratefully acknowledged.

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