A Versatile Common Platform for Quantum Transport Measurements in Fluidic, Cryogenic, and In Situ Electron Microscopy Environments

In Situ Transmission Electron Microscope (TEM) fabrication has made many advances recently, ranging from nanopore fabrication However, to exploit the potential of these devices, measurements and characterization should ideally be possible in situ and also in the environment of the ultimate application, which can range from cryogenic temperatures for quantum computing Here we present wafer-scale fabrication and validation of a common multi-functional extremely low-noise chip platform capable of in situ TEM characterization and fabrication, microfluidic experiments, and cryogenic and scanning probe measurements.