APT Tip Shape Modifications During Analysis, Its Implications, and the Potential to Measure Tip Shapes in Real Time via Soft-X-Ray Ptychography

Journal Article APT Tip Shape Modifications During Analysis, Its Implications, and the Potential to Measure Tip Shapes in Real Time via Soft-X-Ray Ptychography Get access Paul van der Heide, Paul van der Heide IMEC, Kapeldreef 75, Leuven, Belgium Corresponding author: Paul.vanderheide@imec.be Search for other works by this author on: Oxford Academic Google Scholar Igor Mathotkin, Igor Mathotkin IMEC, Kapeldreef 75, Leuven, BelgiumInstituut voor Kern- en Stralingsfysica (IKS), KU Leuven, Celestijnenlaan 200D, Leuven, Belgium Search for other works by this author on: Oxford Academic Google Scholar Wilfried Vandervorst, Wilfried Vandervorst IMEC, Kapeldreef 75, Leuven, BelgiumInstituut voor Kern- en Stralingsfysica (IKS), KU Leuven, Celestijnenlaan 200D, Leuven, Belgium Search for other works by this author on: Oxford Academic Google Scholar Claudia Fleischmann Claudia Fleischmann IMEC, Kapeldreef 75, Leuven, Belgium Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 2504–2505, https://doi.org/10.1017/S1431927619013254 Published: 01 August 2019