Cryogenic STEM Imaging and Spectroscopy of Electron Beam Sensitive Materials

Katherine A. Spoth; Michael J. Zachman; David A. Muller; Lena F. Kourkoutis

doi:10.1017/s1431927619009036

journal article·2019-08Open access

Cryogenic STEM Imaging and Spectroscopy of Electron Beam Sensitive Materials

Katherine A. Spoth, Michael J. Zachman, David A. Muller, Lena F. Kourkoutis

Microscopy and Microanalysis· Volume 25· Issue S2

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Abstract

is scattered into the BF region. The additional signal should allow similar quality imaging with smaller incident dose, important for preserving high-resolution structural information

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advancements in Battery Materials · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques

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References (6)

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1. Supported by NSF (DMR-1654596, DMR-1429155, DMR-1719875) and the Packard Foundation.

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