News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy

Journal Article News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy Get access Adrian Niculae, Adrian Niculae PNDetector GmbH, München, Germany Corresponding author: adrian.niculae@pndetector.de Search for other works by this author on: Oxford Academic Google Scholar Thiago Barros, Thiago Barros PNDetector GmbH, München, Germany Search for other works by this author on: Oxford Academic Google Scholar Alois Bechteler, Alois Bechteler PNDetector GmbH, München, Germany Search for other works by this author on: Oxford Academic Google Scholar Robert Lackner, Robert Lackner PNDetector GmbH, München, Germany Search for other works by this author on: Oxford Academic Google Scholar Kathrin Hermenau, Kathrin Hermenau PNDetector GmbH, München, Germany Search for other works by this author on: Oxford Academic Google Scholar Klaus Heizinger, Klaus Heizinger PNSensor GmbH, München, Germany Search for other works by this author on: Oxford Academic Google Scholar Tristan Mönninghoff, Tristan Mönninghoff PNDetector GmbH, München, Germany Search for other works by this author on: Oxford Academic Google Scholar Heike Soltau, Heike Soltau PNDetector GmbH, München, Germany Search for other works by this author on: Oxford Academic Google Scholar Lothar Strüder Lothar Strüder PNSensor GmbH, München, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 516–517, https://doi.org/10.1017/S1431927619003313 Published: 01 August 2019