Simultaneous Hard X-ray Ptychographic Tomography and X-ray Fluorescence To-mography of Isolated Hollow Core-Shell GaN Rods

M. Kahnt; G. Falkenberg; J. Garrevoet; J. Hartmann; T. Krause; M. Niehle; M. Scholz; M. Seyrich; A. Trampert; A. Waag; H.-H. Wehmann; F. Wittwer; H. Zhou; M. Hanke; C. G. Schroer

doi:10.1017/s143192761801259x

journal article·2018-08Open access

Simultaneous Hard X-ray Ptychographic Tomography and X-ray Fluorescence To-mography of Isolated Hollow Core-Shell GaN Rods

M. Kahnt, G. Falkenberg, J. Garrevoet, J. Hartmann, T. Krause, M. Niehle, M. Scholz, M. Seyrich, A. Trampert, A. Waag, H.-H. Wehmann, F. Wittwer, H. Zhou, M. Hanke, C. G. Schroer

Microscopy and Microanalysis· Volume 24· Issue S2

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OpenAlex topics: Advanced X-ray Imaging Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced Electron Microscopy Techniques and Applications

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References (6)

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