journal article·2018-08Open access

X-ray Microanalysis at High Count Rate with Latest Generation Silicon Drift Energy Dispersive Spectrometer

Philippe T. Pinard, Simon Burgess, John Qing Zhang, James Holland, Peter Statham

Microscopy and Microanalysis· Volume 24· Issue S1

Abstract

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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Ion-surface interactions and analysis

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References (2)

Show source-provided references
1. Microsc. Microanal. · 2016 · 22 · 520
2. Microsc. Microanal. · 2017 · 23 · 46