New STEM/TEM Objective Lens for Atomic Resolution Lorentz Imaging
Source abstract
Abstract
Y Kohno, S Morishita, N Shibata; New STEM/TEM Objective Lens for Atomic Resolution Lorentz Imaging, Microscopy and Microanalysis, Volume 23, Issue S1, 1 Ju
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Force Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
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References (5)
Show source-provided references
1. 10.1093/jmicro/dfp03310.1093/jmicro/dfp033 ↗
2. Nagai · Microscopy · 2015 · 64 · i11210.1093/jmicro/dfv073 ↗
3. 10.1017/S143192761501010710.1017/S1431927615010107 ↗
4. This development was supported by SENTAN, JST..
5. Shirota · J. Electron Microsc. · 1976 · 25 · 303