Development of Quantitative Techniques with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries.
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Abstract
S Bessette, P Hovington, C Kim, R Gauvin, H Demers, K Zaghib; Development of Quantitative Techniques with Time-of-Flight Secondary Ion Mass Spectrometry (T
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Advancements in Battery Materials · Semiconductor materials and devices
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References (4)
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1. Stevie · 2016
2. Wilson · 1989 · 1.6–10
3. Stevie F. A. , et al Surface and Interface Analysis, SIMS proceedings paper, 2014.
4. 10.1002/sca.2130210.1002/sca.21302 ↗