Polymer imaging in SEM—charge, damage and coating free
Source abstract
Abstract
Petr Wandrol, Miroslav Slouf; Polymer imaging in SEM—charge, damage and coating free, Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 1816
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis · Force Microscopy Techniques and Applications
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References (6)
Show source-provided references
1. 10.1017/S143192761600090810.1017/S1431927616000908 ↗
2. 10.1017/S143192761600373110.1017/S1431927616003731 ↗
3. 10.1017/S143192761200827610.1017/S1431927612008276 ↗
4. 10.1016/j.eurpolymj.2012.09.00510.1016/j.eurpolymj.2012.09.005 ↗
5. PLA sample courtesy of I. Novak, M. Valentin, Polymer Institute SAV, Slovakia.
6. The authors acknowledge funding from the Technology Agency of the Czech Republic, TE01020118.