Recognizing and Preventing Artifacts in Microscopy: A Roundtable Discussion
Source abstract
Abstract
E Ann Ellis, Leona Cohen-Gould; Recognizing and Preventing Artifacts in Microscopy: A Roundtable Discussion, Microscopy and Microanalysis, Volume 22, Issue
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Machine Learning in Materials Science
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (10)
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