Atomic-Resolution Composition Mapping in EDS STEM

Nathan R Lugg; Akihito Kumamoto; Ryo Ishikawa; Bin Feng; Gerald Kothleitner; Naoya Shibata; Yuichi Ikuhara

doi:10.1017/s143192761600800x

journal article·2016-07Open access

Atomic-Resolution Composition Mapping in EDS STEM

Nathan R Lugg, Akihito Kumamoto, Ryo Ishikawa, Bin Feng, Gerald Kothleitner, Naoya Shibata, Yuichi Ikuhara

Microscopy and Microanalysis· Volume 22· Issue S3

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Abstract

Nathan R Lugg, Akihito Kumamoto, Ryo Ishikawa, Bin Feng, Gerald Kothleitner, Naoya Shibata, Yuichi Ikuhara; Atomic-Resolution Composition Mapping in EDS ST

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Advanced Materials Characterization Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (7)

Show source-provided references

1. 10.1103/PhysRevB.81.10010110.1103/PhysRevB.81.100101 ↗

2. APL · 2012 · 101 · 183112

3. 10.1016/j.ultramic.2015.05.01010.1016/j.ultramic.2015.05.010 ↗

4. 10.1017/S143192761200120110.1017/S1431927612001201 ↗

5. 10.1016/j.ultramic.2014.11.02910.1016/j.ultramic.2014.11.029 ↗

6. 10.1103/PhysRevLett.112.08550110.1103/PhysRevLett.112.085501 ↗

7. 10.1016/j.ultramic.2014.01.00610.1016/j.ultramic.2014.01.006 ↗