journal article·2014-08

Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions

Yi Jiang, Robert Hovden, David A. Muller, Veit Elser

Microscopy and Microanalysis· Volume 20· Issue S3
Publisher page

Abstract

Yi Jiang, Robert Hovden, David A Muller, Veit Elser; Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions, Microscopy and Micro
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Medical Imaging Techniques and Applications · Advanced X-ray and CT Imaging · Advanced X-ray Imaging Techniques

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