Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction
Source abstract
Abstract
F Bauer, S Sitzman, C Lang, C Hartfield, J Goulden; Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction, Microscopy a
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Electron and X-Ray Spectroscopy Techniques · Metal and Thin Film Mechanics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.