DataVXMicroscopy and MicroanalysisPaper
journal article·2005-08

A Comparison of Nanometrology Using SEM and TEM

J B Warren, B J Panessa-Warren

Microscopy and Microanalysis· Volume 11· Issue S02
Publisher page
Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques

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References

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