Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope
Source abstract
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques
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References
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