Resolving 45 pm with 300 kV Aberration Corrected STEM
Source abstract
Abstract
H Sawada, N Shimura, K Satoh, E Okunishi, F Hosokawa, N Shibata, Y Ikuhara; Resolving 45 pm with 300 kV Aberration Corrected STEM, Microscopy and Microanal
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
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References
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