An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer

M Terauchi; H Takahashi; N Handa; T Murano; M Koike; T Kawachi; T Imazono; N Hasagawa; M Koeda; T Nagano; H Sasai; Y Oue; Z Yonezawa; S Kuramoto

doi:10.1017/s1431927611003898

journal article·2011-07Open access

An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer

M Terauchi, H Takahashi, N Handa, T Murano, M Koike, T Kawachi, T Imazono, N Hasagawa, M Koeda, T Nagano, H Sasai, Y Oue, Z Yonezawa, S Kuramoto

Microscopy and Microanalysis· Volume 17· Issue S2

Publisher page Open full text

Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced Electron Microscopy Techniques and Applications

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