Chemical Characterization of Material Surfaces Using X-ray Photoelectron Spectroscopy (XPS): The Perfect Complement to Electron Microscopy Techniques
Source abstract
Abstract
BR Strohmeier, RG White, TS Nunney, P Mack, AE Wright; Chemical Characterization of Material Surfaces Using X-ray Photoelectron Spectroscopy (XPS): The Per
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Corrosion Behavior and Inhibition
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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