Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis
Source abstract
Abstract
Ralf Terborg, Martin Rohde; Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis, Microscopy and Mic
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Advanced Electron Microscopy Techniques and Applications
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References
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