Comparing different software packages for the mapping of strain from scanning precession diffraction data

Ian MacLaren; Emma Devine; Hristo Gergov; Gary Paterson; K. P. Harikrishnan; Benjamin Savitzky; Colin Ophus; Renliang Yuan; Jian-Min Zuo; Kirsten Forster; Gaja Kobe; Elizabeth Koppany; Kirsten McClymont; Anjelo Narendran; David Riley

doi:10.1017/s1431927621000593

journal article·2021-08Open access

Comparing different software packages for the mapping of strain from scanning precession diffraction data

Ian MacLaren, Emma Devine, Hristo Gergov, Gary Paterson, K. P. Harikrishnan, Benjamin Savitzky, Colin Ophus, Renliang Yuan, Jian-Min Zuo, Kirsten Forster, Gaja Kobe, Elizabeth Koppany, Kirsten McClymont, Anjelo Narendran, David Riley

Microscopy and Microanalysis· Volume 27· Issue S1

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Abstract

Ian MacLaren, Emma Devine, Hristo Gergov, Gary Paterson, K P Harikrishnan, Benjamin Savitzky, Colin Ophus, Renliang Yuan, Jian-Min Zuo, Kirsten Forster, Ga

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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Advanced Surface Polishing Techniques

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