Structural Characterization of Beam Sensitive Pharmaceutical Compounds Using 3D Electron Diffraction-Micro-ED at Low Dose with Pixelated Detectors

Partha Pratim Das; Alejandro Gómez Pérez; Athanassios S. Galanis; Stavros Nicolopoulos

doi:10.1017/s1431927620018395

journal article·2020-08Open access

Structural Characterization of Beam Sensitive Pharmaceutical Compounds Using 3D Electron Diffraction-Micro-ED at Low Dose with Pixelated Detectors

Partha Pratim Das, Alejandro Gómez Pérez, Athanassios S. Galanis, Stavros Nicolopoulos

Microscopy and Microanalysis· Volume 26· Issue S2

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Abstract

Partha Pratim Das, Alejandro Gómez Pérez, Athanassios S Galanis, Stavros Nicolopoulos; Structural Characterization of Beam Sensitive Pharmaceutical Compoun

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (3)

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2. 10.1021/acscentsci.9b0039410.1021/acscentsci.9b00394 ↗

3. 10.1021/acs.oprd.8b0014910.1021/acs.oprd.8b00149 ↗