Quantification of Electron Beam Heating Effect in TEM
Source abstract
Abstract
Hua Guo, Panpan Zhou, Douglas Natelson, Jun Lou; Quantification of Electron Beam Heating Effect in TEM, Microscopy and Microanalysis, Volume 23, Issue S1,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Anodic Oxide Films and Nanostructures
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References (4)
Show source-provided references
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3. Hobbs · 437
4. 10.1038/ncomms598610.1038/ncomms5986 ↗