Enhanced Sensitivity of Atomic-Resolution Spectroscopic Imaging by Direct Electron Detection
Source abstract
Abstract
David J Baek, Berit H Goodge, Di Lu, Yasuyuki Hikita, Harold Y Hwang, Lena F Kourkoutis; Enhanced Sensitivity of Atomic-Resolution Spectroscopic Imaging by
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Force Microscopy Techniques and Applications
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References (5)
Show source-provided references
1. 10.1016/j.ultramic.2014.08.00210.1016/j.ultramic.2014.08.002 ↗
2. 10.1126/science.114882010.1126/science.1148820 ↗
3. 10.1016/j.jsb.2013.10.01610.1016/j.jsb.2013.10.016 ↗
4. This work was supported by the Cornell Center for Materials Research with funding from the NSF (DMR-1120296 and DMR-1429155).
5. 10.1017/S143192761600253110.1017/S1431927616002531 ↗