journal article·2016-07Open access

Using Ma ss Resolving Power as a Performance Metric in the Atom Probe

Fred Meisenkothen, Thomas F. Kelly, Edward Oltman, Joseph H. Bunton, Ludovic Renaud, David J. Larson

Microscopy and Microanalysis· Volume 22· Issue S3

Abstract

Fred Meisenkothen, Thomas F Kelly, Edward Oltman, Joseph H Bunton, Ludovic Renaud, David J Larson; Using Ma ss Resolving Power as a Performance Metric in t
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Hydrogen embrittlement and corrosion behaviors in metals

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References (2)

Show source-provided references
1. 10.1021/ac60259a00710.1021/ac60259a007 ↗
2. 10.1017/S143192760808721710.1017/S1431927608087217 ↗