Semi-statistical Atom Probe Tomography Analysis of Thin Film Grain Boundaries
Source abstract
Abstract
Adam Stokes, Mowafak Al-Jassim, Brian Gorman; Semi-statistical Atom Probe Tomography Analysis of Thin Film Grain Boundaries, Microscopy and Microanalysis,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Metal and Thin Film Mechanics · Diamond and Carbon-based Materials Research
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References
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