Quantitative Measurements of the Penumbra of XEDS Systems in an AEM
Source abstract
Abstract
Nestor J Zaluzec, Jianguo Wen, Jie Wang, Dean J Miller; Quantitative Measurements of the Penumbra of XEDS Systems in an AEM, Microscopy and Microanalysis,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: High voltage insulation and dielectric phenomena · Electron and X-Ray Spectroscopy Techniques · Plasma Diagnostics and Applications
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References (1)
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1. Microanaly · 2014 · 20 · 1318