Large Area Cryo-Planing of Vitrified Samples Using Broad-Beam Ion Milling
Source abstract
Abstract
Abstract On account of its excellent resolution and high throughput, cryoSEM imaging has recently seen resurgence. In this work, we report on the development of cryogenic triple ion gun milling (CryoTIGM™), a broad ion beam milling technique for cryo-planing of vitrified, “frozen-hydrated” specimens. We find that sections prepared with CryoTIGM™ are smooth over exceptionally large areas (~700,000 µm2), and reveal ultrastructural details in similar or better quality than freeze-fractured samples.
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques
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