DataVXMicroscopy and MicroanalysisPaper
journal article·2011-07

An Aberration Corrected FIB for Nano-Area Mass Spectrometry

S Itose, M Matsuya, S Uno, K Yamashita, S Ebata, M Ishihara, K Uchino, H Yurimoto, K Sakaguchi, M Kudo

Microscopy and Microanalysis· Volume 17· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications

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References

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