A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips
Source abstract
Abstract
R Prakash Kolli, Frederick Meisenkothen; A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomograp
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.