Aberration Correction for Analytical In Situ TEM – the NTEAM Concept.
Source abstract
Abstract
B Kabius, CW Allen, DJ Miller; Aberration Correction for Analytical In Situ TEM – the NTEAM Concept., Microscopy and Microanalysis, Volume 8, Issue S02, 1
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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