Project Tomo: Toward Atomic-scale Analytical Tomography
Source abstract
Abstract
Thomas Kelly, Rafal Dunin-Borkowski, Joachim Meyer; Project Tomo: Toward Atomic-scale Analytical Tomography, Microscopy and Microanalysis, Volume 26, Issue
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides
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References (11)
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1. 4. McDermott, RF , Suttle, JR (2015) US Patent: System and Method for Characterizing Ions Using a Superconducting Transmission Line Detector. US Patent 9490112
2. 10.1063/1.491660910.1063/1.4916609 ↗
3. 10.1038/nature2104210.1038/nature21042 ↗
4. 10.1017/S143192761300049410.1017/S1431927613000494 ↗
5. 10.1016/j.elspec.2019.07.00210.1016/j.elspec.2019.07.002 ↗
6. 11. Project Tomo is funded as part of the Ernst Ruska-Centre 2.0 project, which is funded by the federal and state ministries in Germany and the Helmholtz Association.
7. 10.1063/1.505522710.1063/1.5055227 ↗
8. 5. Suttle, J (2018) A Superconducting Ion Detector. Ph.D., The University of Wisconsin - Madison
9. 10.1038/nmat442610.1038/nmat4426 ↗
10. 10. https://www.thermofisher.com/us/en/home/industrial/electron-microscopy/electron-microscopy-instruments-workflow-solutions/spectra-300-s-tem.html
11. 6. We put 100% in quotation marks because all real experiments have noise and other limitations. We expect to approach the ideal of 100% with detection efficiencies that may be 99.9%, for example.