journal article·2019-08Open access

Model-Based EELS Quantification and ELNES Phase Mapping Using Experimentally Measured Cross-Sections

Bernhard Schaffer, Liam Spillane, Paul J. Thomas

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: High voltage insulation and dielectric phenomena · Non-Destructive Testing Techniques · Power Transformer Diagnostics and Insulation

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (3)

Show source-provided references
1. 10.1016/j.ultramic.2010.02.01010.1016/j.ultramic.2010.02.010 ↗
2. Verbeeck · Ultramicroscopy · 2006 · 106 · 11
3. 10.1017/S143192761200669110.1017/S1431927612006691 ↗