Recent Developments in APT Analysis Automation and Support for User-Defined Custom Analysis Procedures in IVAS 4
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Abstract
Journal Article Recent Developments in APT Analysis Automation and Support for User-Defined Custom Analysis Procedures in IVAS 4 Get access AC Day, AC Day Australian Centre for Microscopy and Microanalysis, School of Aerospace, Mechanical and Mechatronics Engineering, The University of Sydney, Sydney, NSW 2006, AustraliaCAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Corresponding author: alec.day@ametek.com Search for other works by this author on: Oxford Academic Google Scholar H Francois-Saint-Cyr, H Francois-Saint-Cyr CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar BP Geiser, BP Geiser CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar T Payne, T Payne CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar E Oltman, E Oltman CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar SP Ringer, SP Ringer Australian Centre for Microscopy and Microanalysis, School of Aerospace, Mechanical and Mechatronics Engineering, The University of Sydney, Sydney, NSW 2006, Australia Search for other works by this author on: Oxford Academic Google Scholar DA Reinhard DA Reinhard CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 338–339, https://doi.org/10.1017/S1431927619002423 Published: 01 August 2019
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OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
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1. 10.1017/S143192760707090010.1017/S1431927607070900 ↗
2. 10.1016/j.ultramic.2018.06.01710.1016/j.ultramic.2018.06.017 ↗
3. Day · Microsc. Microanal · 2019
4. 10.1080/09506608.2016.127072810.1080/09506608.2016.1270728 ↗
5. 10.1016/j.ultramic.2018.02.00610.1016/j.ultramic.2018.02.006 ↗