journal article·2019-08Open access

Progress in Ultra-High Energy Resolution EELS

TC Lovejoy, GJ Corbin, N Dellby, N Johnson, MV Hoffman, A Mittelberger, OL Krivanek

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

Vibrational spectroscopy in the electron microscope The Nion Iris spectrometer [2], incorporated into the Nion High Energy Resolution Monochromated EELS-STEM (HERMES ) system [3] has led to an EELS era in which 5 meV energy resolution can be attained at 30 keV primary energy, and combined with atom-sized electron probes. The progress in energy resolution is illustrated in Fig. Reduced tails of the zero loss peak and better energy resolution make the information content of the more recent spectrum resemble the FTIR spectrum more than the older EELS spectrum, especially in the spectrum region between 50 and 220 meV.
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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Silicon and Solar Cell Technologies

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