Full-Field Hard X-Ray Microscope Designed for Materials Science Applications
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Abstract
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Electron and X-Ray Spectroscopy Techniques
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References (5)
Show source-provided references
1. 10.1038/s41598-017-12141-910.1038/s41598-017-12141-9 ↗
2. J. of Phys.: Conf. Ser. · 2017 · 849 · 012056
3. 10.1016/j.nima.2010.02.06310.1016/j.nima.2010.02.063 ↗
4. 10.1080/14786435.2016.122208710.1080/14786435.2016.1222087 ↗
5. AIP Conf. Ser. · 2016 · 1741 · 1