Correlative In-Situ AFM & SEM & EDX Analysis of Nanostructured Materials
Source abstract
Abstract
M Winhold, M Leitner, A Lieb, P Frederix, F Hofbauer, T Strunz, J Sattelkov, H Plank, CH Schwalb; Correlative In-Situ AFM & SEM & EDX Analysis of N
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1149/2.0711606jes10.1149/2.0711606jes ↗
2. 10.1038/srep1639310.1038/srep16393 ↗