Cryo-FIB Milling and Lift-Out for Preparation of Specimens for Cryo-TEM

Michael J. Zachman; Jade M. Noble; Lena F. Kourkoutis

doi:10.1017/s1431927617012223

journal article·2017-07Open access

Cryo-FIB Milling and Lift-Out for Preparation of Specimens for Cryo-TEM

Michael J. Zachman, Jade M. Noble, Lena F. Kourkoutis

Microscopy and Microanalysis· Volume 23· Issue S1

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Abstract

Michael J Zachman, Jade M Noble, Lena F Kourkoutis; Cryo-FIB Milling and Lift-Out for Preparation of Specimens for Cryo-TEM, Microscopy and Microanalysis,

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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Advanced Materials Characterization Techniques

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References (9)

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5. This work was supported by NSF (DMR-1654596) and the Packard Foundation. It made use of the CCMR Shared Facilities which are supported through the NSF MRSEC program (DMR-1120296).

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