Electron Differential Phase Microscopy with an A-B Effect Phase Plate
Source abstract
Abstract
T Tanji, H Niimi, J Usukura, Y Yamamoto, S Ohta; Electron Differential Phase Microscopy with an A-B Effect Phase Plate, Microscopy and Microanalysis, Volume 21,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1016/0304-3991(96)00033-210.1016/0304-3991(96)00033-2 ↗
2. J. Electronmicrosc · 2011 · 60 · S43
3. Z. Naturforsh · 2a · 615