Using Nion Swift for Data Collection, Analysis and Display

C.E. Meyer; N. Dellby; Z. Dellby; T.C. Lovejoy; M.C. Sarahan; G.S. Skone; O.L. Krivanek

doi:10.1017/s1431927614007272

journal article·2014-08Open access

Using Nion Swift for Data Collection, Analysis and Display

C.E. Meyer, N. Dellby, Z. Dellby, T.C. Lovejoy, M.C. Sarahan, G.S. Skone, O.L. Krivanek

Microscopy and Microanalysis· Volume 20· Issue S3

Publisher page Open full text

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Abstract

CE Meyer, N Dellby, Z Dellby, TC Lovejoy, MC Sarahan, GS Skone, OL Krivanek; Using Nion Swift for Data Collection, Analysis and Display, Microscopy and Mic

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Computational Physics and Python Applications · Machine Learning in Materials Science

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