Ultra-High Energy Resolution EELS
Source abstract
Abstract
TC Lovejoy, NJ Bacon, AL Bleloch, N Dellby, MV Hoffman, OL Krivanek; Ultra-High Energy Resolution EELS, Microscopy and Microanalysis, Volume 23, Issue S1,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (6)
Show source-provided references
1. Krivanek · 2010 · 615
2. Lagos · Nature, accepted · 2017
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5. 10.1103/PhysRevLett.117.25610110.1103/PhysRevLett.117.256101 ↗
6. 10.1098/rsta.2009.008710.1098/rsta.2009.0087 ↗