journal article·2005-02

Determination ofE2for Nitride Ceramics Using FE-SEM and the Duane–Hunt Limit Procedure

M. Brochu, H. Demers, R. Gauvin, M.D. Pugh, R.A.L. Drew

Microscopy and Microanalysis· Volume 11· Issue 1
Publisher page

Abstract

This work demonstrates the possibility of using the Duane–Hunt limit of the bremsstrahlung to determineE2values of Si3N4and AlN ceramics. TheEDHLversusE0graph demonstrates that for conductive materials, the experimental curve is parallel to the theoretical (EDHL=E0), but both curves cross in the case of insulators. The intersection points (E2value), are 3.01 keV for Si3N4and 2.67 keV for AlN. Imaging of ceramic grain structure at high magnification was performed to demonstrate the validity of the calculatedE2values.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced biosensing and bioanalysis techniques · Analytical chemistry methods development

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (8)

Show source-provided references
1. Belhaj, M. , Odof, S. , Msellak, K. , & Jbara, O. (2000).Time-dependent measurement of the trapped charge in electronirradiated insulators: Application toAl2O3-sapphire.J Appl Phys 88,2289–2294.10.1063/1.1287131 ↗
2. Joy, D.C. & Joy, C.S. (1996).Low voltage scanning electron microscopy.Micron 27,247–263.10.1016/0968-4328(96)00023-6 ↗
3. Kramers, H.A. (1923).Phil Mag 46(6th ser),836.10.1080/14786442308565244 ↗
4. Suganuma, K. (1991).Joining non-oxide ceramics. InCeramics and Glasses, Engineered Materials Handbook,Vol. 4, pp.523–531.Materials Park, OH:ASM International.
5. Cazaux, J. (1996).Electron probe microanalysis of insulating materials:Quantification problems and some possible solutions.X-Ray Spectrom 25,1–16.10.1002/(SICI)1097-4539(199611)25:6<265::AID-XRS172>3.0.CO;2-3 ↗
6. Solosky, L.F. & Beaman, D.R. (1972).A simple method for determining the acceleration potential inelectron probes and scanning electron microscopes.Rev Sci Instrum 43,1100–1102.10.1063/1.1685855 ↗
7. Reimer, L. (1998).Scanning Electron Microscopy: Physics of Image Formation andMicroanalysis,Springer Series in Optical Sciences, 2nd ed., Vol. 45.Berlin:Springer.10.1007/978-3-540-38967-5 ↗
8. Myklebust, R.L. , Fiori, C.E. , & Newbury, D.E. (1990).A robust method for determining the Duane–Hunt limit fromenergy-dispersive spectra. InMicrobeam Analysis—1990, Michael, J.P. , Ingram, P. & Williams, D.B. (Eds.), pp.147–149.San Francisco, CA:San Francisco Press.