journal article·2002-08Open access

Applications of a Cs Corrected HRTEM in Materials Science

J.L. Hutchison, J.M. Titchmarsh, D.J.H. Cockayne, G. Möbus, C.J. Hetherington, R.C. Doole, F. Hosokawa, P. Hartel, M. Haider

Microscopy and Microanalysis· Volume 8· Issue S02

Abstract

JL Hutchison, JM Titchmarsh, DJH Cockayne, G Möbus, CJ Hetherington, RC Doole, F Hosokawa, P Hartel, M Haider; Applications of a Cs Corrected HRTEM in Mate
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.