In-situ SEM and TEM Nanomechanical Study of Wear and Failure Mechanisms
Source abstract
Abstract
Sanjit Bhowmick, Eric Hintsala, Douglas Stauffer, SA Syed Asif; In-situ SEM and TEM Nanomechanical Study of Wear and Failure Mechanisms, Microscopy and Mic
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Metal and Thin Film Mechanics · Mechanical stress and fatigue analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1007/s11837-016-2154-010.1007/s11837-016-2154-0 ↗
2. 10.1115/1.299112310.1115/1.2991123 ↗
3. 10.1007/s10853-012-6916-y10.1007/s10853-012-6916-y ↗